Laboratorio Atomic Force Microscopy

Nome laboratorio: ATOMIC FORCE LABORATORY
Responsabile scientifico: Prof. Francesco Ruffino

Luogo: Edificio 6 (piano -1; locale n. 249)*

Luogo: Edifico 10 (piano 1; locale n. 213)**

Morphologycal and electrical characterization of surfaces, nanostructures and thin films.

The laboratory hosts:

1*) an atomic force microscopy INNOVA-BRUKER which allow morphological characterizations with heigth resolution of about 1 Angstrom. It allows, also, conductive mapping and local current-voltage characteristic acquisition, current-distance spectroscopy, surface potential measurements, nanolitography.

 

2**) an atomic force microscopy DriveAFM-Nanosurf which overcomes drawbacks of other tip-scanning instruments and provides atomic resolution (vertical noise: 20 pm) together with fast scanning, fast force spectroscopy, and large scan sizes up to 100 µm. Thanks to innovations in optical beam path engineering and scanner design, the DriveAFM scan head features photothermal actuation and full motorization for superior research performance. The DriveAFM is the perfect solution for high-resolution imaging of demanding samples such as nanostructures, proteins, or polymeric structures (e.g. DNA), and also for larger, micrometer-sized structures.

 

 

Attrezzature

ATOMIC FORCE MICROSCOPE INNOVA BRUKER

Closed-Loop Scanner: XY > 90 µm, Z > 7.5 µm Open-Loop Scanner: XY > 5 µm, Z > 1.5 µm Sample size: X-45 mm x Y-45 mm x Z-18 mm Optics: Camera: on-axis color CCD with motorized zoom Resolution: <2 µm with standard 10x objective (0.75 µm with 50X) Electronics: 20-bit DAC control, 100 kHz ±10v ADCs, digital feedback Equipped to perform conductive measurements Ideal for morphology and electrical characterization of polymers, biomolecules, and semiconductors, nanomanipulation and nanolithography

SCANNING TUNNELING MICROSCOPE NANOSURF-EASYSCAN2
	Maximum Scan Range: 500 nm Maximum Z-Range: 200 nm Current set point : 0.1-100 nA in 25 pA steps Tip voltage: ± 10 V in 5mV steps Tip sample approach: Stick-slip piezo motor Sample size: max 10 mm diameter Modes of operation: constant current mode and constant     height mode

 

 

 

ATOMIC FORCE MICROSCOPE DRIVEAFM NANOSURF
	Open/closed loop operations for XYZ axis Photothermal drive of the cantilever for clean and stable excitation Fully motorized alignment of the photodetector and the light sources Scan size: 100 μm x 100 μm x 20 μm maximum sample size: 150 mm Z-height noise: 20 pm Approach 10 mm motorized, parallel High resolution outputs (DAC): 12x 28 bit, 1 MHz/sampling Standard imaging modes: Static force, dynamic force, phase contrast, MFM, friction force, force modulation, EFM