Lectures on thin films
Dal 15 al 29 ottobre 2021, dalle 15:00 alle 17:00, presso l'Aula B o E del DFA, il Prof. Dr hab. Janusz Jaglarz (Cracow University of Technology, Poland) terrà un ciclo di seminari su Thin films secondo il calendario di seguito indicato.
Il ciclo di lezioni del Prof. Jaglarz è fortemente consigliato agli studenti del 3° Anno del CdL In Fisica e agli studenti della CdL Magistrale in Physics.
Prenotazione posti gratuita ma obbligatoria.
Lecture 1. Optical processes in matter (15/10/2021 15:00-17:00, Aula B)
- Reflection, propagation and transmission of a light beam incident on an optical medium.
- Optical parameters in bulk
- The complex refractive index and dielectric constant
- Optical materials
- Optical physics in the solid state
- Microscopic models of solids, The dipole oscillator model
- Propagation of light in a dense optical medium, optical dispersion
Lecture 2. Elements of wave optics (19/10/2021 15:00-17:00, Aula E)
- The equation of the light wave, Light coherence
- Light diffraction, Fresnel diffraction
- Interference and diffraction on two slits
- Examples of the phenomena of interference and diffraction
- Polarization of light.
- Types of polarization, polarizers and methods of light polarization.
Lecture 3. Thin films optics (22/10/2021 15:00-17:00, Aula B)
- Light at the boundary of two media, boundary conditions for a wave
- Statistical nature of light scattering from the surface
- Reflection and transmision of light from a single layer
- Multiple film systems
- Antireflective film systems
Lecture 4. Thin-Film Applications (02/11/2021 15:00-17:00 CEST online at https://bit.ly/2ZJk8yP )
- Material Characteristics
- Process Technology
- Deposition technologies
- Evaporative Technologies, Plasma Enhanced Chemical Vapor
- Deposition
- Sputtering and Sputter Deposition
- Laser and Electron Beam Assisted Processing
- Ion Beam Deposition
Lecture 5. Thin film metrology (05/11/2021 15:00-17:00 CEST online at https://bit.ly/2ZGM5Ig )
- Classical UV-VIS-NIR spectrophotometry
- Basics of ellipsometry
- definition of ellipsometry
- photometric ellipsometry
- Psi and delta angles
- complementary XRR studies
- Application possibilities